IR-SNOM (NeaSPEC)

The infrared (IR) scattering-type scanning near-field optical microscope neaSNOM provides state-of-the-art laterally resolved (10 nm) IR spectroscopy and complements the existing far-field IR spectroscopy (averaging over μm to mm areas) techniques. The system is able to position samples with nanometer accuracy for the reliable measurement of local near-field spectra. To cover the necessary wavenumber range a broad band "white light" source (supercontinuum laser, 5-15 μm) is used. In addition, high spectral resolution (of 3.2 cm-1) enables observation of narrow vibrational bands and detection of any variations caused, for example, by degradation, orientation changes or doping. In order to measure high-quality IR spectra with an excellent signal-to-noise ratio (via long integration times), precise positioning of the metallic tip (for near-field scattering) and an extremely small temporal drift of the tip are ensured. An additional narrow-band but intense IR light source (a quantum cascade laser) is also attached so that fast imaging and data collection is available with a resolution well below the diffraction limit.

 

For more information please contact Dr. Christian Huck.


 
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Centre for Advanced Materials
Im Neuenheimer Feld 225
D-69120 Heidelberg

Phone: 06221-54 19 999
geschaeftsstelle@cam.uni-heidelberg.de
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